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Ground and VCC Bounce of High-Speed Integrated Circuits
The purpose of this paper is to give a generaldescripTIon of what ground and VCC bounceare, why it is they are tested, and a detaileddescripTIon of how they are tested.WHY SHOULD GROUND AND VCCBOUNCE BE TESTED?Ground and VCC bounce tesTIng is done toevaluate what effect switching more than oneoutput simultaneously has on theperformance of the integrated circuit. Thiseffect becomes important in anyhigh-performance line of circuits because thepropagaTIon delays and output edge rates arevery fast. This can cause ground bounce andVCC bounce, described as Voltage OutputLow Peak (VOLP) and Voltage Output HighValley (VOHV), respectively.Fast edge rates of the output drivers canteam up with internal parasitic leadinductance and the output load to produceunwanted side effects of noise on theoutputs. This noise or ringing will occur onboth a static and a switching output. Thisringing can be substantial enough to crossthe input triggering threshold of a subsequentdevice, which in turn can cause a system toperform unpredictably and unreliably.
