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The evoluTIon of IC design is driven by a conTInuous demand for increased performance. Thispush translates into more funcTIonality and increasing complexity. Design closure is getTIng moredifficult to achieve at each subsequent node because of new process effects and variability thatimpact design functionality and performance.More accurate extraction and simulation is required to help designers converge on an optimaldesign that has a high certainty of achieving yield at the target specifications, without costly andtime-consuming over-design. Time-to-market pressures dictate that a solution to this problemmust fit into existing design flows for a wide range of design applications and not increase thecycle time.Traditional parasitic extraction tools are unable to meet the parasitic accuracy criteria at 28 nmand below. IC designers at these nodes need to extract parasitics with field solver accuracy toevaluate the effects of parasitics on circuit timing and functionality, without compromisingperformance. Rule-based extractors are fast, but they are not designed to extend to evertighteningaccuracy requirements. Traditional field solvers are not designed to deliver theneeded performance. These limitations force designers to build in extra design margins, whicheliminates the benefits of moving to a smaller node in the first place.Enter Calibre® xACT 3D—a new product designed to provide the reference-level accuracy of a 3Dfield solver coupled with fast performance and high scalability. Calibre xACT 3D leverages itsintegration into the established best-in-class production design sign-off flow with Calibre LVSand its device and interconnect modeling infrastructure for maximum usability. This paperdetails how the Calibre xACT 3D extraction solution addresses the extraction challenges fordesign signoff at advanced nodes.
