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Development of a tilt measurement system based on MEMS sensor and Cortex_M3

  • 资源大小:0.46 MB
  • 上传时间:2021-12-10
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  • 资源积分:1积分
  • 标      签: 嵌入式 处理器

资 源 简 介

TIlt measurement system is a device used to measure   the TIlt angle of the carrier to horizontal plane, which is   widely used in atTItude measurement fields such as   MUAV, robot, motorcar, ship and so on. The   accelerometer can be used for the TIlt measurement   because of its measurement principle. With the   development of MEMS technology, the MEMS   accelerometer becomes the best choice to design the   micro tilt measurement system for its small size, low   power, low cost and strong anti-impact force although its   measurement accuracy is lower. Recently how to design   the micro tilt measurement system with proper chips and   how to deduce the measurement error are studied[1-4]。   This paper designs a low-cost, small-size and   fast-response tilt measurement system. The contribution   of this work focuses on two aspects. One is sticking the   3-axis MEMS accelerometer on some plane of a   hexahedron and compensating for the accelerometer   sensitivity drift with temperature by the sensor in the   microcontroller, which makes calibration and error easier   and less. The next is using a Cortex-M3 microcontroller to   process data, which makes the power consumption and the   performance of the system lower and higher.   The remainder of this paper is organized as follows. In   Section II we will briefly introduce the measuring   principle and the structure of the tilt measurement system.   In Section III we will describe the hardware design of the   system. In Section Č we will show how to compensate   the drift error of the accelerometer with the temperature.   In Section č we will describe the algorithm realization of   the system. In Section Ď experimental results are
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