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With more complex integrated circuits and more denselypacked PC boards, testability is a major issue. One solutionto the testability problem is boundary scan. The XC4000/XC5200-Series Field Programmable Gate Arrays (FPGAs)include boundary scan registers that meet the requirementsof the IEEE1149.1 standard. While this standardprovides for diagnostic testing and supports built-in self-test(BIST), one of its primary objectives is the testing of theinterconnections between ICs. This is achieved using amandatory external test mode, called EXTEST.
